Author Christoph Cichos
Measurement of electrical double layer potential for oxides by means of semiconductor field-effect. Pomiary potencjału elektrycznej warstwy podwójnej dla tlenków przy użyciu tranzystora polowego (in Polish)
Physicochem. Probl. Miner. Process. 1980;12(1):58-68
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| eISSN: | 2084-4735 |
| ISSN: | 1643-1049 |
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